The circuit has been designed for transistors to determine whether the pin is emitter, base or collector as well as the type if NPN or PNP polarity, and can also be used in testing diodes. 4011 – a ...
WEST LAFAYETTE, Ind. – Researchers at Purdue University have created a "unified model" for predicting the reliability of new designs for silicon transistors – a potential tool that industry could use ...
Researchers at Purdue University have created a "unified model" for predicting the reliability of new designs for silicon transistors – a potential tool that industry could use to save tens of ...
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