Testing multiple devices at the same time is not providing the equivalent reduction in overall test time due to a combination of test execution issues, the complexity of the devices being tested, and ...

Testing multiple devices in parallel using the same ATE results in reduced test time and lower costs, but it requires engineering finesse to make it so. Minimizing test measurement variation for each ...

Developing an automated production test solution for current and next-generation complex RF SIP/SOC devices is an increasingly difficult task. Both the test program and the device interface board (DIB ...

Increased device complexity can be addressed by providing parallel test while decreasing the throughput overhead of the ATE architecture. The consumer world is converging, and the lines between ...

The complexity of electronic-device testing varies widely, ranging from the simplest type—manual testing—to the most complex—large-scale automatic test equipment (ATE). In between simple manual ...