With the continuing manufacture of new computers, there is a clear and obvious trend of the parallel port becoming less and less common. For our younger readers; the parallel port is an interface ...

Time is money in electronics, as in other industries, and the more time that is invested in testing chips means more costs being added to the product in question. To speed up testing for memory ...

So I'm trying to detect through Visual Basic 6.0 when a voltage change occurs on one of the pins of the serial/parallel port. The whole thing is pretty simple; no data transfer/handshaking/etc needs ...

Testing multiple devices in parallel using the same ATE results in reduced test time and lower costs, but it requires engineering finesse to make it so. Minimizing test measurement variation for each ...

As the transistor geometry shrinks, more transistors are packed on to a single chip, reducing manufacturing cost on a per-transistor basis. The result, however, is more transistors to test; hence, ...

Keithley Instruments has announced the publication of Parallel Test Technology: The New Paradigm for Parametric Testing, a handbook that covers semiconductor parametric testing. The free, 60-page book ...