A comparison of experimental annular dark field (ADF)-scanning transmission electron microscopy (STEM) and electron ptychography in uncorrected and aberration-corrected electron microscopes. In the ...
In this article, we look at some of the key developments of various microscopy techniques over the last few years and how they have benefitted different areas of research and development. The impact ...
Researchers have shown that expensive aberration-corrected microscopes are no longer required to achieve record-breaking microscopic resolution. Researchers at the University of Illinois at ...
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