ATI Technologies Inc. reported that it has implemented an embedded deterministic test (EDTTM) tool from Mentor Graphics Corp. in the testing of a new 90nm graphics processor. The Modular TestKompress ...

While semiconductor design engineers become more aware of silent data corruption (SDC) or silent data errors (SDE) caused by aging, environmental factors, and other issues, embedded test solutions are ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...

Applications such as smart cards and devices used in the defense industry require security features to ensure that sensitive data is inaccessible to outside agents. This used to be a niche requirement ...

Embedded systems are increasingly moving towards multicore processors and systems on a chip (SoC) to improve performance. Execution time of critical real-time tasks can be impacted by data and control ...